منابع مشابه
THE DETERMINATION OF THICKNESS AND OPTICAL CONSTANTS FOR PbSe FILM FROM IR REFLECTANCE SPECTRA
The transmittance values measured in IR reflection-absorption (RA) spectra were used to determine the optical constants of dielectric films laid on solid substrates. When the recorded spectra show interference fringes, one can determine the film thickness. The PbSe film thickness was obtained by interpreting the interference fringes from the reflexion-absorption IR spectra recorded at two diffe...
متن کاملThickness and optical constants measurement of thin film growth with circular heterodyne interferometry
In this article, we report an alternative method for in situ monitoring of the thickness and refractive index of thin film during the growth process. We design a special structure with a thickness-controlled air film to simulate the process of thin film growth. The phase term of the reflected light coming from this multi-layer structure is modulated and has a strong correlation with the thickne...
متن کاملPrecorneal and pre- and postlens tear film thickness measured indirectly with optical coherence tomography.
PURPOSE To demonstrate the feasibility of indirectly measuring the precorneal tear film thickness and pre- and postlens tear film (PLTF) thickness using optical coherence tomography (OCT). METHODS Central corneal thickness (C(1)) which includes the tear film (T) of both eyes of 40 non-contact lens wearers was measured using OCT after calibration. The mean age of the 40 subjects was 31.2 +/- 9...
متن کاملInfluence of Film Thickness on Optical Properties of Hydrogenated Amorphous Silicon Thin Films
A detailed study of the dependence of optical constants on thickness for vacuum-deposited hydrogenated amorphous silicon thin films is reported. The thicknesses of the films range from 190 nm to 540 nm. The refractive index n(λ), absorption coefficient α(λ), extinction coefficient k(λ) and consequently the band gap, are determined from the spectrophotometric measurements of the film transmittan...
متن کاملInfluence of film thickness on the optical transmission through subwavelength single slits in metallic thin films.
Silver and gold films with thicknesses in the range of 120-450 nm were evaporated onto glass substrates. A sequence of slits with widths varying between 70 and 270 nm was milled in the films using a focused gallium ion beam. We have undertaken high-resolution measurements of the optical transmission through the single slits with 488.0 nm (for Ag) and 632.8 nm (for Au) laser sources aligned to t...
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ژورنال
عنوان ژورنال: Journal of the Surface Finishing Society of Japan
سال: 1989
ISSN: 0915-1869,1884-3409
DOI: 10.4139/sfj.40.248